17–19 Feb 2026
Palazzo dei Priori, Perugia, Italy
Europe/Rome timezone

Characterization of X-ray Radiation Effects on Ferroelectric Materials for Improved Electronic Devices

17 Feb 2026, 14:10
1m
Sala dei Notari (Palazzo dei Priori, Perugia, Italy)

Sala dei Notari

Palazzo dei Priori, Perugia, Italy

Piazza 4 Novembre - PERUGIA ITALY

Speaker

Arianna Morozzi (INFN, Perugia (IT))

Description

Future High Energy Physics (HEP) experiments
demand particle detectors with unprecedented performance,
particularly in terms of radiation hardness, low power consumption,
and enhanced signal detection in increasingly harsh
environments. This work explores the significant potential of
ferroelectric MOSFETs (FeFETs), leveraging their unique negative
capacitance (NC) properties, as a promising solution for
these challenges. We discuss their radiation hardness, critical
for long-term stability under high radiation fluences. Their
electrical characteristics before and after X-ray irradiation up
to 100 Mrad(SiO2) is presented.

Authors

Arianna Morozzi (INFN, Perugia (IT)) Tayeb Youcef Belabbas (IOM-CNR and INFN, Perugia (IT)) Roberto Mulargia (University & INFN Turin (IT)) Prof. Daniele Passeri (Universita e INFN Perugia (IT)) Enrico Robutti (INFN e Universita Genova (IT)) Alessandro Rossi (Universita e INFN, Perugia (IT)) Francesco Moscatelli (IOM-CNR and INFN, Perugia (IT))

Presentation materials