Speaker
Description
Polycrystalline CVD (pcCVD) diamond is an attractive detector material for harsh radiation environments because of its radiation tolerance, fast signal formation, low leakage current, and availability in large areas. Its signal response is, however, degraded by charge trapping associated with defects and grain boundaries, leading to reduced charge collection and distorted transient signals. We present a CCD-based simulation workflow in Allpix Squared that predicts detector-level signal degradation from the charge collection distance (CCD), an experimentally accessible parameter that can be provided by the manufacturer or measured in the laboratory. Measured CCD values of a pcCVD diamond sensor were used as direct input to the implemented trapping model, and the resulting simulated transient current signals were compared with transient-current-technique measurements of the same detector. The simulations reproduce the principal characteristics of the measured waveforms, including reduced charge collection, pulse-shape degradation, and overall signal duration. This demonstrates that CCD provides a practical interface between laboratory characterization and detector-response simulation in Allpix Squared, enabling efficient studies of material quality, operating conditions, and radiation-induced signal degradation in pcCVD diamond detectors.