Speaker
Description
The reliability of CERN control systems, including power converters, RF systems, and safety electronics, is essential for LHC operation. These systems operate in harsh radiation environments, subject to Total Ionizing Dose (TID), Displacement Damage (DD), and Single Event Effects (SEEs). While cumulative effects can be assessed through part- and system-level testing, stochastic SEEs present a greater challenge due to their random nature. For the High-Luminosity LHC, increased radiation levels combined with strict system failure limits necessitate precise component-level cross-section targets. This paper presents a methodology to propagate system-level SEE requirements down to part-level targets and define qualification conditions, including test fluence and sample quantities. A dedicated setup at the CERN CHARM mixed-field facility enables simultaneous irradiation of large numbers of components, ensuring efficient qualification while maintaining system reliability under HL-LHC conditions.
