Speaker
Prof.
Gian-Franco Dalla Betta
(INFN and University of Trento)
Description
Surface effects were found to significantly affect the electrical characteristics of double-sided 3D detectors fabricated at FBK.
With reference to 3D test diodes, we have studied the layout dependence of some critical parameters such as leakage current, breakdown voltage and capacitance both experimentally and with the aid of TCAD simulations.
Simulations are found to accurately reproduce the device characteristics, thus explaining the basic mechanisms governing
the electrical behavior and providing useful hints for layout optimization.
Authors
Prof.
Gian-Franco Dalla Betta
(INFN and University of Trento)
Dr
Marco Povoli
(University of Trento and INFN)
Co-authors
Dr
Alvise Bagolini
(FBK)
Dr
Elisa Vianello
(FBK)
Dr
Francesca Mattedi
(FBK)
Gabriele Giacomini
(Fondazione Bruno Kessler)
Maurizio Boscardin
(FBK Trento)
Nicola Zorzi
(Fondazione Bruno Kessler - FBK)
