8th International Conference on Large Scale Applications and Radiation Hardness of Semiconductor Detectors (RD07)

Name: 8th International Conference on Large Scale Applications and Radiation Hardness of Semiconductor Detectors (RD07)
Start: 2007-06-27T09:00:00+02:00
End: 2007-06-29T19:00:00+02:00
Location: Florence, Italy

27–29 Jun 2007

Florence, Italy

Europe/Zurich timezone

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Carlo.Civinini@fi.infn.it

The AMS tracker, construction and performance

28 Jun 2007, 14:55

25m

Sala Convegni della Cassa di Risparmio di Firenze (Florence, Italy)

Sala Convegni della Cassa di Risparmio di Firenze

Florence, Italy

Via F. Portinari, 5

Day 2 - Afternoon session

Paolo Zuccon (INFN sezione di Perugia)

Slides

ZuccconRD07.pdf

8th International Conference on Large Scale Applications and Radiation Hardness of Semiconductor Detectors (RD07)

Support

The AMS tracker, construction and performance

Sala Convegni della Cassa di Risparmio di Firenze

Florence, Italy

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Primary author

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8th International Conference on Large Scale Applications and Radiation Hardness of Semiconductor Detectors (RD07)

Support

Speaker

Primary author

Presentation materials