8th International Conference on Large Scale Applications and Radiation Hardness of Semiconductor Detectors (RD07)

Name: 8th International Conference on Large Scale Applications and Radiation Hardness of Semiconductor Detectors (RD07)
Start: 2007-06-27T09:00:00+02:00
End: 2007-06-29T19:00:00+02:00
Location: Florence, Italy

27–29 Jun 2007

Florence, Italy

Europe/Zurich timezone

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Carlo.Civinini@fi.infn.it

Results on CMS Tracker Outer Barrel Integration

27 Jun 2007, 10:50

25m

Sala Convegni della Cassa di Risparmio di Firenze (Florence, Italy)

Sala Convegni della Cassa di Risparmio di Firenze

Florence, Italy

Via F. Portinari, 5

Day 1 - Morning Session

Christoph Bloch (Technische Universitaet Wien (TU))

Slides

BlockRD07_20070727.pdf

BlockRD07_20070727.ppt

8th International Conference on Large Scale Applications and Radiation Hardness of Semiconductor Detectors (RD07)

Support

Results on CMS Tracker Outer Barrel Integration

Sala Convegni della Cassa di Risparmio di Firenze

Florence, Italy

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Primary author

Presentation materials

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8th International Conference on Large Scale Applications and Radiation Hardness of Semiconductor Detectors (RD07)

Support

Speaker

Primary author

Presentation materials