8th International Conference on Large Scale Applications and Radiation Hardness of Semiconductor Detectors (RD07)

Name: 8th International Conference on Large Scale Applications and Radiation Hardness of Semiconductor Detectors (RD07)
Start: 2007-06-27T09:00:00+02:00
End: 2007-06-29T19:00:00+02:00
Location: Florence, Italy

27–29 Jun 2007

Florence, Italy

Europe/Zurich timezone

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Carlo.Civinini@fi.infn.it

1 cm Thick Silicon Detectors at Liquid Helium Temperature

29 Jun 2007, 15:50

25m

Sala Convegni della Cassa di Risparmio di Firenze (Florence, Italy)

Sala Convegni della Cassa di Risparmio di Firenze

Florence, Italy

Via F. Portinari, 5

Day 3 - Afternoon session

Dr Giovanni Carugno (INFN - Padova)

Slides

1_cm_Silicon(Ge)Detectors.pdf

1_cm_Silicon(Ge)Detectors.ppt

8th International Conference on Large Scale Applications and Radiation Hardness of Semiconductor Detectors (RD07)

Support

1 cm Thick Silicon Detectors at Liquid Helium Temperature

Sala Convegni della Cassa di Risparmio di Firenze

Florence, Italy

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8th International Conference on Large Scale Applications and Radiation Hardness of Semiconductor Detectors (RD07)

Support

Speaker

Primary author

Presentation materials