8th International Conference on Large Scale Applications and Radiation Hardness of Semiconductor Detectors (RD07)

Name: 8th International Conference on Large Scale Applications and Radiation Hardness of Semiconductor Detectors (RD07)
Start: 2007-06-27T09:00:00+02:00
End: 2007-06-29T19:00:00+02:00
Location: Florence, Italy

27–29 Jun 2007

Florence, Italy

Europe/Zurich timezone

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Carlo.Civinini@fi.infn.it

Short p-Type Silicon Microstrip Detectors in 3D-stc technology

27 Jun 2007, 17:30

25m

Sala Convegni della Cassa di Risparmio di Firenze (Florence, Italy)

Sala Convegni della Cassa di Risparmio di Firenze

Florence, Italy

Via F. Portinari, 5

Day 1 - Afternoon session

Simon Heiko Eckert (Fakultaet fuer Physik)

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Firenze_RD07_Eckert_5.pdf

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8th International Conference on Large Scale Applications and Radiation Hardness of Semiconductor Detectors (RD07)

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