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08:15
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Registration
()
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08:45
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Welcome and Introduction to the Course
- Dr
Massimo Mazzillo
(STMicroelectronics)
()
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09:00
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Semiconductor Manufacturing Processes
-Dr
Giuseppe Arena
(STMicroelectronic)
(until 14:00)
()
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09:00
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Brief Introduction of STMicroelectronics and Microelectronics Historical Notes
- Dr
Giuseppe Arena
(STMicroelectronics)
()
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09:30
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Semiconductors Processing and Devices Fabrication - 1st part (crystal growth and epitaxy, thermal oxidation, ion implantation and diffusion)
- Dr
Giuseppe Arena
(STMicroelectronics)
()
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10:40
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--- Coffee break ---
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11:00
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Semiconductors Processing and Devices Fabrication – 2nd part (Thin film deposition, photolithography, plasma basics, etching and new trends in microelectronics industry)
- Dr
Giuseppe Arena
(ST Microelectronics)
()
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12:45
|
--- Lunch break ---
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08:15
|
Visit to STMicroelectronics M5 8” Clean Room Facilities
-Dr
Giovanni Vitale
(ST Microelectronics)
(until 14:30)
()
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08:15
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First Group Visit (19 Participants)
()
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10:45
|
Second Group Visit (19 Participants)
()
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13:15
|
--- Lunch break ---
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14:00
|
Electrical Testing, Assembly and TCAD Simulations.
-Dr
Stefano Sannella
(ST) Dr
Federico Ziglioli
(STMicroelectronics) Dr
Cristina Miccoli
(ST)
(until 16:50)
()
|
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14:00
|
Electrical Parametric Testing
- Dr
Stefano Sannella
(ST)
()
|
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14:50
|
Electronic Devices Packaging
- Dr
Federico Ziglioli
(STMicroelectronics)
()
|
|
15:40
|
TCAD Process and Device Simulations
- Dr
Cristina Miccoli
(STMicroelectronics)
()
|
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16:30
|
--- Coffee break ---
|
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16:50
|
Technology Development and Applications
-Dr
Giuseppina Valvo
(STMicroelectronics) Dr
Sergei Dolinsky
(GE Global Research Center)
(until 18:30)
()
|
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16:50
|
STMicroelectronics Silicon Photomultiplier Technology
- Dr
Giuseppina Valvo
(ST Microelectronics)
()
|
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17:40
|
Time-of-Flight PET Detector Development with SiPMs
- Dr
Sergei Dolinsky
(GE Global Research Center)
()
|
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18:30
|
--- Social dinner ---
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14:30
|
Surface Analysis and Solids Characterization
-Dr
Domenico Mello
(ST Microelectronics) Dr
L. Renna
(ST Microelectronics)
(until 18:50)
()
|
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14:30
|
X-Ray Photoelectron Spectroscopy (XPS) and Secondary Ion Mass Spectrometry (SIMS)
- Dr
Lucio Renna
(ST Microelectronics)
()
|
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15:30
|
Optical Microscopy, Fault Detection and Isolation Techniques
- Dr
Domenico Mello
(ST Microelectronics)
()
|
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16:30
|
--- Coffee break ---
|
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16:50
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Samples Preparation and Transmission Electron Microscopy (TEM)
- Dr
Domenico Mello
(ST Microelectronics)
()
|
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17:50
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Focused Ion Beam (FIB) and Scanning Electron Microscopy (SEM)
- Dr
Domenico Mello
(ST)
()
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18:50
|
Conclusions and Debriefing
()
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