Speaker
Helen O'Keeffe
(University of Oxford)
Description
Single pi0 production is one of the most significant backgrounds in the T2K nu-e appearance measurement and due to uncertainties in the production cross-section, it is one of the most difficult to constrain. Measurements of neutral current single pion production in the near detector can be extrapolated to the far detector and used to constrain this background. An analysis that uses a specific two-gamma signature in the tracker region of the near detector to select such events has been developed and will be used to extract production rates in the near future. This talk will describe selection cuts used, expected purity and selection efficiency derived from analysis of Monte Carlo samples. Comparisons of Monte Carlo distributions with those from a sub-set of data will be shown and a projection of the expected number of events for 3 x 10E20 PoT exposure (Run I+II+III) will be given.
Author
Helen O'Keeffe
(University of Oxford)
