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Front End Electronics (FEE 2014)

19–23 May 2014
Argonne National Laboratory
US/Central timezone

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Session

Advanced CMOS and Extreme Environments Session II

23 May 2014, 10:15
Energy Sciences Building (Argonne National Laboratory)

Energy Sciences Building

Argonne National Laboratory

Argonne National Laboratory 9700 S. Cass Avenue Lemont, IL 60439

Conveners

Advanced CMOS and Extreme Environments Session II

  • Gary Varner (University of Hawaii)

Presentation materials

There are no materials yet.

  1. 40. Radiation Damage Tests at 1 Grad Dose on 65 nm CMOS Transistors
    Marlon Benoit Barbero (CPPM France)
    23/05/2014, 10:15
  2. 41. LArASIC4 Noise Results in Liquid Argon Long Drift Tests
    Dr Igor Kreslo (Universitaet Bern (CH))
    23/05/2014, 10:40
  3. 42. CMOS Lifetime at 300K and at 77K
    Shaorui Li (BNL)
    23/05/2014, 11:05
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