Front End Electronics (FEE 2014)

Session

Advanced CMOS and Extreme Environments Session II

23 May 2014, 10:15

Energy Sciences Building (Argonne National Laboratory)

Conveners

Advanced CMOS and Extreme Environments Session II

• Gary Varner (University of Hawaii)

40. Radiation Damage Tests at 1 Grad Dose on 65 nm CMOS Transistors

Marlon Benoit Barbero (CPPM France)

23/05/2014, 10:15

41. LArASIC4 Noise Results in Liquid Argon Long Drift Tests

Dr Igor Kreslo (Universitaet Bern (CH))

23/05/2014, 10:40

42. CMOS Lifetime at 300K and at 77K

Shaorui Li (BNL)

23/05/2014, 11:05