Feb 15 – 19, 2016
Vienna University of Technology
Europe/Vienna timezone

The investigation of the internal structure of SiPM from KETEK, ZECOTEK, HAMAMATSU and SENSL companies after the neutron irradiation.

Not scheduled
15m
Vienna University of Technology

Vienna University of Technology

Gusshausstraße 27-29, 1040 Wien
Board: 98
Poster SiPM

Speaker

Dr Vasilij Kushpil (NPI CAS, Rez, Czech Republic)

Description

We will present recent results on the investigation of changes in the KETEK, ZECOTEK, HAMAMATSU and SENSL SiPM properties after irradiation by the 0 - 35 MeV neutrons. The typical neutron fluence was about 10^12 n/cm^2. The changes of the internal structure of the irradiated SiPMs was studied by the measuring of the C-V and C-F characteristics. The spectral distribution of the noise before and after irradiation was investigated. We have observed the strong influence of the SiPM manufacturing technology on their radiation hardness. The application of the obtained results to the development of the readout electronics is discussed.

Primary author

Dr Vasilij Kushpil (NPI CAS, Rez, Czech Republic)

Presentation materials