Dr
Ehrenfried Seebacher
(Austriamicrosystems)
13/09/2005, 09:00
We discuss state of the art and new developments for the characterization of CMOS
technologies.
In the first chapter the most important issues of MOS transistor modeling will be
shown. Topics like AC/DC modeling, noise modeling and temperature modeling for the
MOS transistor will be explained. State of the art MOS transistor models like the
BSIM3 and BSIM4 models as well as the...
Dr
Massimo Manghisoni
(Università degli Studi di Bergamo)
13/09/2005, 09:45
Oral
Deep submicron CMOS technologies are widely used for the implementation
of low noise front-end electronics in various detector applications. In this field
the designers’ effort is presently focused on 0.13 micron technologies. This work
presents the results of noise measurements carried out on CMOS devices in 0.13 um
commercial processes from different foundries. The study also...
Dr
Marcel Stanitzki
(Yale University)
13/09/2005, 10:10
Oral
The CDF Silicon Vertex detector consists of three subdetectors: SVX-II,
ISL and L00. Altogether it consists of 8 layers of Silicon with more than 750000
readout channels. This detector is essential for CDF's high precision tracking and
is vital for the forward tracking capabilities and the identification of heavy
flavor decays. After four years of data taking in Run-II and a delivered...
