6th RD50 - Workshop on Radiation hard semiconductor devices for very high luminosity colliders

Session

Defect and Material Characterization

2 Jun 2005, 10:00

0--E204 (Physicum campus, University of Helsinki, Finland)

4. Admittance spectroscopy study of point defects and nano-clusters in irradiated high-purity silicon

Klaus Johansen (University of Oslo)

02/06/2005, 10:00

5. X defect after Co-60 gamma irradiation

Frank Hönniger (University of Hamburg)

02/06/2005, 10:20

6. Photoinduced transient spectroscopy of epitaxial silicon irradiated with high proton fluences

Pawel Kaminski (Institute of Electronic Materials Technology)

02/06/2005, 10:40

7. Irradiation damage in sublimation grown 6H-SiC

Mads Mikelsen (University of Oslo)

02/06/2005, 11:00