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30 June 2016 to 1 July 2016
Other Institutes
Europe/Zurich timezone

"4H" X-ray Camera

Not scheduled
10m
Auditorium & Conference Room (Other Institutes)

Auditorium & Conference Room

Other Institutes

ESADE Business School, Avenida Pedralbes, 60-62, 08034 Barcelona, Spain.

Speaker

Zhehui Wang (Los Alamos National Laboratory)

Description

Fast X-ray imaging using 30 keV and above X-ray photons is highly desirable for studies of dynamic material evolution and discovery of new materials. The state-of-the-art single-line-of-sight X-ray camera technology, which is mostly based on silicon sensors and silicon Application Specific Integrated Circuits (ASICs), cannot meet the requirements because the atomic number of silicon is only 14 (“Low-Z”), and the highest speed achieved so far is less than 10 MHz frame-rate in X-ray Free Electron Laser (XFEL) environment. Fast readout chips with an equivalent frame rate above 100 MHz do exist through on-board data storage. Therefore, it is possible to construct “4H” X-ray cameras for high-energy XFELs. “4H” stands for high-Z (Z>30) sensor, high-resolution (less than 300 micron pixel pitch), high-speed (above 100 MHz), and high-energy (above 30 keV in photon energy).

Summary

We discuss progress and plans to realize such a technology.

Primary author

Zhehui Wang (Los Alamos National Laboratory)

Co-authors

Andrei Zarubin (Tomsk State University, Russia) Anton Tyazhev (Tomsk State University, Russia) Gideon Robertson (Sandia National Lab, USA) John Goett III (Los Alamos National Lab, USA) John Porter (Sandia National Lab, USA) Liam Claus (Sandia National Lab, USA) Marco Sanchez (Sandia National Lab, USA) Oleg Tolbanov (Tomsk State University, Russia)

Presentation Materials

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