10th International Meeting on Front-End Electronics (FEE 2016)

Session

Deep submicron

31 May 2016, 14:00

AGH University of Science and Technology

Conveners

Deep submicron

• Tomasz Fiutowski (AGH University of Science and Technology (PL))

18. Front end electronics for silicon strip detectors in submicron technologies

Jan Kaplon (CERN)

31/05/2016, 14:00

19. FE65_P2: Prototype Pixel Readout Chip in 65nm for HL-LHC Upgrades

Tomasz Hemperek

31/05/2016, 14:25

20. Noise measurements on 65 nm CMOS transistors at very high total doses

Valerio Re

31/05/2016, 14:50