BI Seminars

SR-based emittance diagnostics

by Toshiyuki Mitsuhashi (KEK)

Europe/Zurich
874/R-018 - salle de réunion activité CCC (CERN)

874/R-018 - salle de réunion activité CCC

CERN

CCC Glass box
20
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Description

A conceptual design for Emittance diagnostics through beam size measurement using the Synchrotron radiation (SR) is studied for the FCC. In the FCC e-e, for a measurement of vertical beam size, the apparent beam size is estimated to an order of nano-radian in the angular diameter due to estimated long distance between the source point and measurement apparatus. Since already existing methods to measure the beam size using the SR can cover a few 100nrad, we need to introduce new method for beam size measurement in FCC-ee. For this issue, we make a conceptual design for the X-ray interferometer to measure nano-radian order beam size. The X-ray interferometer was actively investigated around 1920-30 to measure the absolute value of the wavelength of X-rays. We have researched a simple Young's double slit interferometer configuration for the FCC-ee. Also some SR monitor studies are made for FCC H-H. In the FCC H-H, visible SR from bending magnet is useable for energy range from the injection to top energy. X-ray region SR will be only available for the energy range upper than 30TeV. The instrumentation using the visible SR such as imaging system, SR interferometer, coronagraph and streak camera seems usable for all energy range. For the top energy, the X-ray pinhole camera will be convenient for beam diagnostics of emittance through the beam size measurement. For the source point, a high b-section is necessary to obtain enough resolution, especially for halo measurement with the coronagraph.