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13:50
Capacitance Measurements and Depletion Voltage for Annealed Fz and MCz Diodes
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Jessica Metcalfe
(Department of Physics and Astronomy-University of New Mexico-Unk)
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14:10
Determination of depletion voltage from CV, IV and CCE measurements on Pad Detectors
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Katharina Kaska
(Technische Universitaet Wien)
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14:30
Electrical Characterization of Irradiated Silicon Diodes at Different Temperature
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Vladimir Khomenkov
(Hamburg University)
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14:50
TCT-Measurements of mixed irradiated Magentic Czochralski Diodes in the SLHC-Scenario
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Robert Eber
(IEKP, UNI-Karlsruhe (TH))
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15:10
Charge collection and trapping effects in n-type and p-type epitaxial silicon diodes after proton irradiation
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Joern Lange
(Hamburg University)
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16:00
Determination of strip detector properties by using Edge-TCT
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Gregor Kramberger
(Jozef Stefan Institute)
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16:20
New TCT setups at CERN and Louvain
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Manuel Fahrer
(CERN)
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16:40
Predictions on charge collection efficiency in heavily irradiated Si detectors basing on the approach of active base region
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Elena Verbitskaya
(Ioffe Physical Technical Inst.)
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17:00
Contributions of Electrons and Holes to Total Collected Charge in Heavily Irradiated Si Pad and Strip/Pixel Detectors: A Comparison Simulation Study
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Zheng Li
(BNL)
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17:20
Bias on-off proton irradiation results on MCz-Si and Fz-si detectors
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Jasu Haerkoenen
(Helsinki Institute of Physics HIP)
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17:40
Sensor R&D for an upgrade of the CMS pixel barrel
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Jennifer Ann Sibille
Jennifer Ann Sibille
(University of Kansas-Unknown-Unknown)
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18:00
Discussion Session
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Eckhart Fretwurst
(Hamburg University)
Gregor Kramberger
(Jozef Stefan Institute)