20–22 Mar 2017
CERN
Europe/Zurich timezone

The application of metrology research in industry

20 Mar 2017, 16:55
25m
503/1-001 - Council Chamber (CERN)

503/1-001 - Council Chamber

CERN

162
Show room on map
Presentation Metrology aspects

Speaker

Mr Craig Davey (Insphere)

Description

Industry 4.0 presents a direct challenge to companies involved in high-value manufacturing - exploit new metrology processes to deliver highly automated, well-controlled manufacturing solutions, or face getting left behind by your competitors.

We set up Insphere Ltd to help companies facing this exact challenge. We focus our research activities on applying emerging metrology processes to deliver quantifiable business benefits to our customers.

In this presentation I will draw on case studies of projects we have delivered over the last year to outline the successful strategies that we have used.

  • In a highly focussed trial using real components, we demonstrated the
    speed and accuracy of a fully automated inspection in an aerospace setting.
  • We helped a company to introduce locked-down metrology user interfaces to “de-skill” complex metrology-guided assembly operations, massively reducing costs.
  • We have delivered a funded research programme to achieve robust process control in additive manufacturing, promoting wider acceptance
    of this exciting technology.

We have found that well-managed research can deliver strong business benefits and overcome the inertia that might otherwise prevent advances in manufacturing methods. Companies must “keep their eyes on the prize” as successful automation offers huge market advantages but can only be achieved with a focus on robust, data-driven manufacture, and dimensional metrology research is a key factor in this success.

Author

Mr Craig Davey (Insphere)

Presentation materials