Speaker
Description
We have studied the growth of perfluoro-pentacene films on Ag(110) with photoelectron emission microscopy (PEEM) and differential (optical) reflectance spectroscopy (DRS). The setup allows recording PEEM images and DRS spectra simultaneously, providing the unique opportunity to correlate the morphology and electronic structure (PEEM) with the associated optical response (DRS). We will demonstrate how linearly polarized light can be used in PEEM to differentiate between changes of the work function and effects related to the density of electronic states and their particular symmetry. In parallel, the reflectance of linearly polarized light in the DRS experiments can be used to follow the evolution of the optical anisotropy of the organic film.
