RD-53 Conference Talks (Public)

Luis Miguel Jara Casas, RADECS 2017, "Study of Total Ionizing Dose Effects in 65nm Digital Circuits with the DRAD Digital RADiation Test Chip"

Name: Luis Miguel Jara Casas, RADECS 2017, "Study of Total Ionizing Dose Effects in 65nm Digital Circuits with the DRAD Digital RADiation Test Chip"
Start: 2017-10-04T12:00:00+02:00
End: 2017-10-04T14:00:00+02:00
Location: No location set

Wednesday 4 Oct 2017, 12:00 → 14:00 Europe/Zurich

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Luis Miguel Jara Casas, RADECS 2017, "Study of Total Ionizing Dose Effects in 65nm Digital Circuits with the DRAD Digital RADiation Test Chip"