17–22 Jun 2018
Europe/Zurich timezone
15th European Vacuum Conference

An analysing tool for analogue residual gas spectra in UHV implying machine-learning applications

20 Jun 2018, 14:40
20m
Room 4 (CICG)

Room 4

CICG

Contributed Vacuum Science & Technology Vacuum Science & Technology

Speaker

Berthold Jenninger (CERN)

Description

We present an algorithm that helps identifying components and contaminants in a residual gas spectrum. At first the possible weighted contribution to the measured spectrum for each reference out of a library is determined and ranked. A residual gas spectrum, in logarithmic scale, is then reconstructed by simulation based on partial pressures and fragmentation patterns of the most likely components and compared with the measured spectrum. The algorithm takes into account analyser specific parameters such as noise, electronic offset and sensitivity.
Residual gas analysis is also to a great part pattern recognition. This is a typical application for machine-learning tools. Such tools, however, need to be trained with a large number of spectra. The fact that residual gas spectra can be simulated in a rather realistic way with the upper mentioned method gives the possibility to train such tools with thousands of simulated randomised gas mixtures. The outcome of a feasibility study about the usefulness of using machine-learning applications for the recognition of residual gas components is presented. Such a tool may then be a complementary and faster approach of identification of residual gas components.

Author

Berthold Jenninger (CERN)

Co-authors

Antoine Benoit (CERN) Vincent Baglin (CERN) Paolo Chiggiato (CERN) Dr Fernando Mateo (IDAL, University of Valencia, Spain) Prof. Emilio Soria-Olivas (IDAL, University of Valencia, Spain) Dr Juan Gomez (IDAL, University of Valencia, Spain)

Presentation materials

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