Speaker
Description
Speaker: David Murer
Abstract: Hybrid Photon Counting (HPC) X-ray detectors have revolutionized the fields of single crystal- and powder diffraction over the past 10 years, and are now also increasingly used for imaging applications in medicine and industry. HPC detectors are comprised of a sensor part and a readout part, with the sensor bump bonded to the readout ASIC. An appropriate ASIC design gives the detector noise-free photon counting, a near ideal modulation transfer function significantly superior to indirect detection systems and virtually unlimited dynamic range. The detectors employ multiple energy-calibrated thresholds for each pixel; and a counter is incremented for each event exceeding the respective thresholds. This enables the resolution of the X-rays in multiple energy bins.
This work will give a broad overview of different applications of HPC detectors for applications in industrial testing and inspection. Experimental results of application- and characterization tests with DECTRIS HPC detectors will be presented, with an emphasis on the spectral capabilities. The talk will conclude with a discussion on the future of photon counting detectors for testing and inspection applications. Which hurdles need to be overcome for a wider adoption? How can their advantages be exploited? What gaps need closing?
