Speaker
Dr
J. Michael Burgess
(MPE)
Description
The future of x-ray polarimetry looks bright. Unfortunately, the sources we look at are not. Low and high count measurements both require proper statistical treatment and the literature on polarization statistics is derived from regularity conditions designed for optical measurements. I will discuss these approaches and present a new approach appropriate for both idealized and real x-ray polarimeters. Additionally, I will show that concepts such as "bias" are purely the result of improper statistical treatment.
