Description
Ongoing data analysis projects
Merlin Reynaard Kole
(Universite de Geneve (CH))
29/11/2018, 09:30
Dr
J. Michael Burgess
(MPE)
29/11/2018, 10:15
The future of x-ray polarimetry looks bright. Unfortunately, the sources we look at are not. Low and high count measurements both require proper statistical treatment and the literature on polarization statistics is derived from regularity conditions designed for optical measurements. I will discuss these approaches and present a new approach appropriate for both idealized and real x-ray...
Merlin Reynaard Kole
(Universite de Geneve (CH))
29/11/2018, 11:10
Jianchao Sun
(Institute of High Energy Physics, Chinese Academy of Sciences)
29/11/2018, 11:30
