26–30 Aug 2019
Universität Zürich
Europe/Zurich timezone

【235】Development of a Low-Temperature Scanning Field Emission Microscope with Spin Polarization Analysis

28 Aug 2019, 19:00
1h 30m
Lichthof

Lichthof

Poster Surfaces, Interfaces and Thin Films Poster Session

Speaker

Ann-Katrin Thamm (ETH Zürich)

Description

In the last years we established a new technology by using an in-house build STM in field emission regime. The emitter source (STM tip) is placed few nanometers away from the sample, where direct tunneling is suppressed. A part of the primary beam is backscattered (elastic and inelastic) from the sample and can escape the tip-target junction. The spin polarization of these electrons, which is a fingerprint of the surface magnetization, is analyzed with a Mott detector. We develop a new low-temperature STM (4 K) not only to increase the stability of the experiment and to reduce noise but also to be able to study fundamental spin structures.

Author

Ann-Katrin Thamm (ETH Zürich)

Co-authors

Dr Thomas Michlmayr (ETH Zürich) Dr Urs Ramsperger (ETH Zürich) Prof. Danilo Pescia (ETH Zürich)

Presentation materials

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