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Description
In this work we present the implementation of a sinusoidal modulation of the magnetic field to a Reflectance Difference Magneto-Optical Kerr Effect (RDMOKE) setup with increased sensitivity that allows detecting variations of the Kerr rotation angle below 1 μrad/mT at applied fields of a few mT. We illustrate the capabilities of the setup for Ni thin films grown on Cu(110)-(2x1)O surfaces that exhibit a sharp spin reorientation transition (SRT) of the magnetic easy axis from in-plane to out-of-plane at a coverage of 9 ML. Additional frequency analysis of the magneto-optic response to the magnetic field reveals new details of the Ni-SRT and demonstrates the potential of the setup for studying ultrathin organic/ferromagnetic interfaces.