Dr
Aleksandar Matkovic
(Institute of Physics, Montanuniversitaet Leoben)
This study aims at direct imaging of contact resistance in MoS2-based thin film transistors (TFTs). Exfoliated single-crystal flakes of MoS2 have been used in a bottom-contact TFT configuration. Pyrimidine-containing self-assembled monolayers (SAMs) were employed to tune the work function of gold electrodes. Kelvin probe force microscopy measurements were carried out during operation of the devices in order to directly image potential drops across the channel and to study the influence of different SAM treatments on the contact resistance. By independently imaging potential drops at both carrier injection and extraction points, we demonstrate asymmetry of contact resistances in MoS2-based TFTs, as well as their non-linear and bias-dependent behavior.
Dr
Aleksandar Matkovic
(Institute of Physics, Montanuniversitaet Leoben)
Dr
Andreas Petritz
(Joanneum Research MATERIALS, Weiz, Austria)
Dr
Gerburg Schider
(Joanneum Research MATERIALS, Weiz, Austria)
Dr
Markus Krammer
(Institute of Solid State Physics, NAWI Graz, Graz University of Technology, Graz, Austria)
Markus Kratzer
(M)
Dr
Esther Karner-Petritz
(Joanneum Research MATERIALS, Weiz, Austria)
Dr
Alexander Fian
(Joanneum Research MATERIALS, Weiz, Austria)
Ms
Herbert Gold
(Joanneum Research MATERIALS, Weiz, Austria)
Dr
Michael Gärtner
(Institut für Anorganische und Analytische Chemie, Goethe-University Frankfurt, Germany)
Prof.
Andreas Terfort
(Institut für Anorganische und Analytische Chemie, Goethe-University Frankfurt, Germany)
Christian Teichert
(Institute of Physics, Montanuniversität Leoben)
Prof.
Egbert Zojer
(Institute of Solid State Physics, NAWI Graz, Graz University of Technology, Graz, Austria)
Prof.
Karin Zojer
(Institute of Solid State Physics, NAWI Graz, Graz University of Technology, Graz, Austria)
Dr
Barbara Stadlober
(Joanneum Research MATERIALS, Weiz, Austria)
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