26–30 Aug 2019
Universität Zürich
Europe/Zurich timezone

【168】Sparse Sampling in Scanning Probe Microscopy

28 Aug 2019, 19:00
1h 30m
Lichthof

Lichthof

Poster Condensed Matter Physics (KOND) Poster Session

Speaker

Mr Jens Oppliger (University of Zurich)

Description

The serial nature of a scanning probe microscope (SPM) renders data taking not only slow but may even prevent complex measurement tasks due to time limitations. Here we introduce the concept of compressed sensing (CS) as an effective sampling routine for SPM, requiring a significantly smaller subset of data points without compromising the measured information content. Our approach relies only on the sparsity of information in a vector domain to fulfill the requirements of CS theory. As an example we demonstrate precise reconstruction of the Cu(111) surface state wavevector from a 10-fold undersampled measurement, where the sparsity is given in Fourier space. We expect that our approach will be transformative for laboratories involved in Quantum Point Interference studies.

Author

Mr Jens Oppliger (University of Zurich)

Co-author

Prof. Fabian Natterer (University of Zurich)

Presentation materials

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