SLDO RD53B testchip A

Europe/Zurich
14/4-030 (CERN)

14/4-030

CERN

20
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    • 1
      Expected performance testchip A: Bandgaps
      • performance studies:
        across temperature, across radiation, combined
      • differences wrt to RD53A bandgaps in performance
      Speakers: Gianluca Traversi (Universita and INFN (IT)), Gianluca Traversi (University of Bergamo)
    • 2
      Expected performance testchip A: SLDO part
      • performance across temperature, across radiation, combined
      • differences wrt to RD53A SLDO performance
      • differences in layout wrt to RD53A and 2.0ASLDO testchip (before RD53A)
      Speakers: Andreas Stiller (Fachhochschule Dortmund), Michael Karagounis (University of Bonn (DE))
    • 3
      Summary of all simulations of testchip A
      • Summary of simulations done with testchip v1
      • Vref cap variations
      • Oscillations when using USP VS type of load (ohmic, DC)
      • Startup: differences seen in simulation wrt to RD53A (oscillations, needed current)
      • Behavior with USP deactivated (not disconnected)
      • Other effects seen in simulation to be verified with measurements
      Speaker: Alvaro Pradas Luengo (Aragon Institute of Technology (ES))
    • 4
      testchip A measurements
      • Thermal effects
      • Irradiation results
      • USP VS type of load
      Speaker: Dominik Koukola (Vienna University of Technology (AT))
    • 5
      Discussion for further steps
      • Critical items for testchip v2
      • Major differences in performance expected in the next version
      • First things to test/validate if it arrives before the review
      • Improvements in the startup
      Speakers: Andreas Stiller (Fachhochschule Dortmund), Gianluca Traversi (University of Bergamo), Gianluca Traversi (Universita and INFN (IT)), Michael Karagounis (University of Bonn (DE))