FuTuRe 2019 - Workshop on the Future of Silicon Detector Technologies
CiS Forschungsinstitut fuer Mikrosensorik
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Arrival and Registration
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Welcome addressSpeaker: Prof. Thomas Ortlepp (CiS)
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Introduction of SiDE Business Unit of CiSSpeaker: Ralf Mario Roder (CIS Institut fuer Mikrosensorik GmbH (DE))
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Readout Electronics: Part I
Sensors have to transfer signals to electronics. Current trends in electronics and highlights of modern sensor technology will be discussed.
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tbdSpeaker: Prof. Nobuyuki Yoshikawa (Yokohama National University)
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tbdSpeaker: Mr Yoshi Hironaka (Yokohama National University)
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10:40
Coffee Break
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Readout Electronics: Part II
Sensors have to transfer signals to electronics. Current trends in electronics and highlights of modern sensor technology will be discussed.
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Superconducting NbN Hot-Electron Bolometer as a Fast Diagnostic Tool for Accelerator Light Sources: System and Readout DesignSpeaker: Mr Alexander Schmid (Karlsruhe Institut für Technologie)
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tbdSpeaker: Prof. Thomas Ortlepp (CiS)
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12:15
Lunch Break
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Dosimetry in Radiation Therapy: Part I
There is a strong need for developing new kinds of detectors for both traditional radiotherapy and particle radiation therapy that enable the precise localization of the dose.
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Introduction to Processes and Workflow in Radiation OncologySpeaker: Mr Johannes Schilz (Strahlenschutzseminar in Thüringen e.V.)
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tbdSpeaker: Mr Rafael Kranzer (PTW Freiburg)
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tbdSpeaker: Mrs Stephanie Schade (Technische Hochschule Mittelhessen)
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15:00
Coffee Break
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Dosimetry in Radiation Therapy: Part II
There is a strong need for developing new kinds of detectors for both traditional radiotherapy and particle radiation therapy that enable the precise localization of the dose.
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Semiconductor-based detectors for dosimetry in radiation therapySpeaker: Prof. Wolfgang Krautschneider (TU Hamburg)
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From detectors for proton cancer therapy to atomic defect characterizations with positronsSpeaker: Dr Andreas Wagner (HZDR Nuclear Physics Division)
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19:00
Workshop Dinner Villa Haage
Villa Haage
Kressepark Erfurt, Motzstraße 8tram No. 6, direction Steigerstraße
station: Milchinselstraße
proceeding Steigerstraße (south west) until Motzstraße, right turn
50.961801, 11.014969
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Arrival and Registration
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Sensor Development for X-Rays: Part I
New insights into health, materials, environmental and other sciences this can only be done when sensors and detectors are produced and optimised in respect of lateral, time and energy resolution and high dynamics. It has to be discussed how this can be achieved on wafer, assembly and electronics level.
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Detector Development for Photon Science at PSISpeaker: Bernd Schmitt (Paul Scherrer Institut)
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Towards soft X-ray detection using LGAD sensorsSpeaker: Jiaguo Zhang (Paul Scherrer Institut)
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10:00
Coffee Break
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Sensor Development for X-Rays: Part II
New insights into health, materials, environmental and other sciences this can only be done when sensors and detectors are produced and optimised in respect of lateral, time and energy resolution and high dynamics. It has to be discussed how this can be achieved on wafer, assembly and electronics level.
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tbdSpeaker: Jonathan Correa Magdalena (Deutsches Elektronen-Synchrotron DESY)
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Doping Profiles for Shallow JunctionsSpeaker: Tobias Wittig (CIS Institut fuer Mikrosensorik GmbH (DE))
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Discussion
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12:00
Lunch Break
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Defect Engineering: Part I
The greatest challenges in defect engineering occur mainly in those sensors and detectors that are exposed to intense high energy radiation.
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Density Functional Theory-based theory of defectsSpeaker: Prof. Erich Runge (Technische Universität Ilmenau)
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Development of Radiation Hard Silicon Detectors - The RD50 collaborationSpeaker: Michael Moll (CERN)
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Light-induced defects in silicon solar cells: a possible impact on the mainstream silicon technologySpeaker: Mr Teimuraz Mchedlidze (TU Dresden)
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14:30
Coffee Break
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Defect Engineering: Part II
The greatest challenges in defect engineering occur mainly in those sensors and detectors that are exposed to intense high energy radiation.
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Defects in 6“ Cz Si EPI-waferSpeaker: Mrs Daniela Seifert (X-FAB Semiconductor Foundries GmbH)
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Low gain avalanche detectors (LGAD) – Can the A_Si-Si_i defect explain their insufficient radiation hardness?Speaker: Kevin Lauer (CIS Institut fuer Mikrosensorik GmbH (DE))
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Discussion
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End of the workshop
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