9–11 Sept 2021
University of Zurich
Europe/Zurich timezone

A comparative study of LGAD radiation damage mechanisms

Not scheduled
20m
Irchel Campus (University of Zurich)

Irchel Campus

University of Zurich

University of Zurich Winterthurerstrasse 190 CH-8057 Zurich

Speaker

Dr Vagelis Gkougkousis (CERN)

Description

Aiming to a sub 30 psec time resolution at fluences in excess of $6×10^{15}$ 1 MeV $n_{eq}/cm^{2}$, several dopants are explored to improve radiation tolerance of intrinsic gain sensors. Using a common mask, CNM produced LGADs with boron, boron + carbon and gallium implanted gain layers are subjected to neutron and proton irradiation ranging from $10^{14}$ to $6×10^{15}$ 1 MeV $n_{eq}/cm^{2}$ on both particle species. A systematic study of acceptor removal, gain reduction and timing performance is presented at different temperatures ($-10^{o}C$, $-20^{o}C$, $-30^{o}C$). Charge collection, relative efficiency, signal shape and noise analysis are also addressed, using charged particles in a laboratory setup. Three different approaches are used to individually evaluate different mechanisms of radiation damage and their effect on sensor performance, with a distinction between bulk and gain layer effects. Finally, stability is evaluated via dark count rate, which combined with efficiency, determines the sensor's operatable region and it's evolution with radiation.

Primary authors

Dr Vagelis Gkougkousis (CERN) Lucia Castillo Garcia (IFAE - Barcelona (ES)) Victor Coco (CERN)

Presentation materials

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