16 June 2020
Virtual Event
Europe/Rome timezone

CIEL: Current Injection Efficiency and Lifetime

16 Jun 2020, 09:50
Virtual Event

Virtual Event

5. Diagnostics: any other topics


Romain Broucquart (SOLEIL)


We will introduce a new acquisition system for storage ring beam current monitor.
It is based on the co-developped PandBox electronics, associated with a 24 bits 128kS/s ADC.
It offers the possibility of fast, triggered captures to measure injected current even during bursted injections.
We'll show the results of the first tests and the integration of this new measure.

Primary author

Presentation Materials