Hamburg University (DE)
Author in the following contributions
- Charge collection characterization of irradiated diode using a novel edge-on electron beam technique
- Defect investigations of electron irradiated p-type Si sensors
- Structural, compositional and defect studies on hadron irradiated B-doped silicon diodes
- The boron-oxygen (BiOi) defect complex induced by irradiation with 23 GeV protons in p-type epitaxial silicon diodes
