The focus of this QA-day virtual event is to introduce quality assurance and reliability testing for Silicon Trackers in HEP.
The lectures will review the main concepts of quality assurance and reliability testing in HEP with some real-life examples of QA problems, reliability issues and consequences. A presentation of a dedicated laboratory for QA and reliability testing will be given.
In addition, an overview of the radiation tolerance characterization, describing the irradiation facilities, with their specific advantages and drawbacks will be presented. The employed testing standards and the testing infrastructures will be introduced as well as the requirements for selecting and testing materials for harsh radiation environments.
