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11:00 AM
Overview on profile measurements of nano-beams
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Thibaut Lefevre
(CERN)
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11:20 AM
Measuring nanometer beam size at final focus
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Toshiyuki Okugi
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11:40 AM
High resolution cavity BPMS. From prototype to larger production
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Alexey Lyapin
(University of London (GB))
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12:00 PM
Non-invasive beam measurement using polarisation radiation
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Pavel Karataev
(University of London (GB))
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12:20 PM
X-band transverse deflection structure with variable polarisation
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Barbara Marchetti
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12:40 PM
Measuring femtosecond bunches using Electro-optical techniques
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Serge Bielawski
(Université de Lille - Sciences et Technologies)