Speaker
Description
Abstract
The radiation effects community in the United States is facing challenges on two fronts: grow capacity for low-energy (≤50 MeV/amu) heavy ion single-event effects (SEE) testing and expand capabilities for high-energy (≥100 MeV/amu) SEE testing. These needs are driven by the evolution of semiconductor technology as well as the types and number of civil space systems required to meet human and science exploration goals. Development and efficient use of heavy ion SEE testing infrastructure is more than just technical requirements – economic models are also an important consideration for long-term sustainability.
Short biography
Jonathan “Jonny” Pellish is employed at the Goddard Space Flight Center as the National Aeronautics and Space Administration’s Electronic Parts Manager, responsible for workforce development and stewardship as well as coordinating Agency-wide technical activities in the electronic parts and radiation effects engineering communities. Jonny is also the deputy manager for the NASA Electronic Parts and Packaging (NEPP) Program, which is operated by NASA Goddard for the NASA Office of Safety and Mission Assurance.
Jonny received the B.S. degree in physics from Vanderbilt University in 2004, and the M.S. and Ph.D. degrees in electrical engineering from Vanderbilt University in 2006 and 2008. From 2007–2008 Jonny held an IBM Ph.D. Fellowship, which included a co-op position at the IBM Austin Research Laboratory. Jonny has authored or co-authored over 70 refereed publications in addition to numerous conference and workshop presentations. He is a member of the American Institute of Aeronautics and Astronautics and the Institute for Electrical and Electronics Engineers.
