Speaker
Jialei WANG
(KU Leuven - RADSAGA ESR5)
Description
A flexible SRAM based SEU radiation monitor has been designed, simulated and tested. Its SEU sensitivity can be tuned by varying the cells supply voltage. The data collected from heavy ions, high-energy protons, neutrons and low-energy protons shows that changing the core voltage of the chip can significantly affect the SEU sensitivity.
