Speaker
Description
Abstract of the presentation
The test of electronic components to radiation effects is the first step of radiation hardness assurance, to demonstrate their capability to meet the mission system requirements. After a short introduction on ESA’s missions, the presentation will address the evolution of technologies, the increasing complexity of space systems, and the challenges to test electronic components. It will conclude on the test facility essentials for a conclusive test.
Short biography
V. Ferlet-Cavrois is at the European Space Agency (ESA) since 2009. She is presently Head of the Power Systems division, encompassing solar generation, energy storage and power management and distribution, EMC, and Space Environment and effects, for satellite platform and payloads. The division is part of in the Technology and Product Assurance directorate (D/TEC), which provides support to all ESA missions. She is responsible for the human resources and technical activities, technology developments and project support. Before joining ESA, she was at CEA – Commissariat à l’Energie Atomique – since 1991, working on radiation interactions and effects, and developing radiation hardened technologies and components, with CEA LETI and STMicroelectronics. In 2005, she received the HDR “Habilitation à Diriger des Recherches”, Habilitation Research Director, from the University of Grenoble. She authored about 200 publications, and received several awards. She is Fellow of the Institute for Electrical and Electronics (IEEE), for contributions to understanding of radiation effects on electronic devices, since 2011.
