Speaker
Description
In WP2, the focus has been set on reliable state-of-the-art electronic components. Devices of strategic importance, for industrial and technological applications, such as a high-reliability integrated time-based signal processing circuit or a CMOS imager have been designed in mainstream CMOS technologies, with the requirement of tolerating radiation levels, orders of magnitude larger than those which currently available commercial components can withstand. In addition, the combined influence of stochastic and cumulative radiation effects (i.e. synergetic effects) together with the coupled impact of radiation and aging (i.e. coupled effects) have been carefully studied in order to decisively improve the link between the experimental and operational contexts. This crucial point also required the use of predictive tools both for soft and hard errors (SET and SEL), which served as a means of developing "Radiation Hardened By Design" (RHBD) components.
