System-level tests play a significant role in electronic devices' qualification and in combination with the component-level testing gives a more precise understanding of their behavior in the harsh radiation environment. They are especially relevant in the case of accelerators, where highly complex systems are employed and a high degree of reliability is imposed. System-level tests must...
Device integration and advanced packaging bring several challenges to standard radiation hardness assurance practices. These are mainly related to sensitivity to weakly ionizing particles as well as ensuring the representativeness of the test, such as the use of protons as a proxy to ions. The relevance of these emerging out-of-the-standard radiation effects was assessed for singly-charged...
