Closely linked to WP2, WP3 addressed the decisive question of how system tests will be able to provide reliability information as opposed to the standard bottom-up individual component characterization, which is hardly practical for modern digital integrated circuits hosting a vast amount of devices. This WP made also use of the results obtained in WP1, as the feasibility and preparation of a...
The objective of this work, in the context of the European RADSAGA project, is to propose a new methodology for radiation hardness assurance of digital systems. We investigate the possibility to define an intermediate approach that would combine the concept of system-level testing with the existing knowledge and best practices of component-level methods. Our methodology is developed and...
In this presentation, main results related to the system qualification methodology development will be presented. The focus will be given on the opportunities that one may get thanks to the system-level testing as well as the definition of the main limitations for the qualification based on the system-level radiation tests. Because the complete system qualification, i.e. the one that would...
