Session

RADSAGA WP3 - Qualification Requirements at System Level

18 May 2021, 09:00
CERN

CERN

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  1. Prof. Alexander Koelpin (BTU), Alexander Kolpin (Friedrich Alexander Univ. Erlangen (DE))
    18/05/2021, 09:00

    Closely linked to WP2, WP3 addressed the decisive question of how system tests will be able to provide reliability information as opposed to the standard bottom-up individual component characterization, which is hardly practical for modern digital integrated circuits hosting a vast amount of devices. This WP made also use of the results obtained in WP1, as the feasibility and preparation of a...

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  2. Israel Da Costa Lopes (University of Montpellier - RADSAGA ESR13)
    18/05/2021, 09:15

    The objective of this work, in the context of the European RADSAGA project, is to propose a new methodology for radiation hardness assurance of digital systems. We investigate the possibility to define an intermediate approach that would combine the concept of system-level testing with the existing knowledge and best practices of component-level methods. Our methodology is developed and...

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  3. Tomasz Krzysztof Rajkowski (3D Plus - RADSAGA ESR12), Tomasz Rajkowski
    18/05/2021, 09:40

    In this presentation, main results related to the system qualification methodology development will be presented. The focus will be given on the opportunities that one may get thanks to the system-level testing as well as the definition of the main limitations for the qualification based on the system-level radiation tests. Because the complete system qualification, i.e. the one that would...

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  4. Jan Budroweit (DLR )
    18/05/2021, 10:05

    This talks is devoted to the design, development and verification of a novel SDR platform for space applications. Due to the required performance, a use of commercial off-the-shelf (COTS) devices is unavoidable. The design presents a new risk assessment approach for the use of COTS components in critical space applications, with a specific focus on radiation effects. Key-technology devices of...

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