Speaker
Frédéric Wrobel
Description
Neutrons, protons and ions are particles are able to trigger Single Event Upset in modern technologies. In this talk, we’ll see how these particles can interact with the matter of the electronic device, create some electron-pairs in the semiconductor and how the resulting parasitic current can lead to an SEE. We will also present the key parameters that are required in order to evaluate the sensitivity of a given technology. The main quantities such as fluence, flux, cross section will be explained, and some case studies will be presented.
