Help us make Indico better by taking this survey! Aidez-nous à améliorer Indico en répondant à ce sondage !

24–28 Oct 2022
University of Santiago de Compostela
Europe/Madrid timezone

Analysis of semiconductor detectors using MeV ion beams

27 Oct 2022, 17:35
20m
Classroom 3, Facultad de Ciencias de la Comunicación (University of Santiago de Compostela)

Classroom 3, Facultad de Ciencias de la Comunicación

University of Santiago de Compostela

Campus Norte, Av. de Castelao, s/n, 15782 Santiago de Compostela, Spain
Oral Contribution P8 Nuclear Physics Applications P8 Nuclear Physics Applications

Speaker

Prof. Javier Garcia-Lopez (Centro Nacional de Aceleradores, Sevilla, Spain)

Description

In this talk, we will first briefly present the infrastructure available at the Centro Nacional de Aceleradores, based on a 3 MV tandem accelerator and a compact cyclotron, which are employed for different Nuclear Physics applications, as the characterization and modification of materials using Ion Beams, the development of nuclear instrumentation, the irradiation of electronic devices and the research with neutrons. Then we will describe the fundamentals of the Ion Beam Induced Current (IBIC) technique, a methodology employed to evaluate the spectrometric and transport properties of semiconductor detectors.
Some illustrative examples of the IBIC technique will be shown, including the dose rate dependence on the generation of point defects in Si diodes, the analysis of silicon-based Low Gain Avalanche Detectors (LGAD) for high energy physics research and the spectroscopic response of SiC diodes at high temperature with interest in nuclear fusion.

Primary author

Prof. Javier Garcia-Lopez (Centro Nacional de Aceleradores, Sevilla, Spain)

Co-authors

Dr Maria del Carmen Jimenez-Ramos (Centro Nacional de Aceleradores, Sevilla, Spain) Mr Adrian Garcia Osuna (Centro Nacional de Aceleradores, Sevilla, Spain)

Presentation materials

There are no materials yet.