TI-LGAD: beta, test beam and TCT characterization

1 Dec 2022, 09:40
20m
Salón de Grados, 2nd Floor (ETSI Seville)

Salón de Grados, 2nd Floor

ETSI Seville

Escuela Técnica Superior de Ingenieros Camino de los Descubrimientos s/n 41092 Isla de la Cartuja, Sevilla Spain

Speaker

Matias Senger (University of Zurich (CH))

Description

We present results of a systematic characterization of the novel Trench-Isolated LGAD (TI-LGAD) technology using a radioactive beta source setup as well as a test beam. New results from a TCT setup are presented and compared with previous ones. The devices under study belong to the first production of pixelated TI-LGADs at FBK carried out in the framework of the RD50 collaboration. The TI-LGAD is a variation of the Low-Gain Avalanche Detector (LGAD) in which the isolation between neighboring pixels is achieved by etching trenches in the inter-pad area. TI-LGADs display the same outstanding performance as LGADs in terms of time resolution, while at the same time allowing for a smaller inter-pixel distance. Several structures have been tested at different irradiation fluences in our beta setup at the University of Zurich.

Primary authors

Anna Macchiolo (University of Zurich (CH)) Ben Kilminster (University of Zurich (CH)) Matias Senger (University of Zurich (CH)) Stefanos Leontsinis (University of Zurich (CH))

Co-authors

Giacomo Borghi (FBK - Fondazione Bruno Kessler (IT)) Giovanni Paternoster (FBK - Fondazione Bruno Kessler (IT)) Matteo Centis Vignali (FBK) Maurizio Boscardin (FBK Trento) Dr Vagelis Gkougkousis (CERN)

Presentation materials