Speaker
Cristian Quintana San Emeterio
(Universidad de Cantabria and CSIC (ES))
Description
A radiation tolerance study of planar diodes fabricated on a SiC substrate will be presented. TPA-TCT and TRIBIC methods were used to characterize the samples. The measurement campaign was carried out at the laser facility of the EHU-UPV university and the CNA microbeam.
Authors
Cristian Quintana San Emeterio
(Universidad de Cantabria and CSIC (ES))
Efren Navarrete Ramos
(Universidad de Cantabria and CSIC (ES))
Esteban Curras Rivera
(CERN)
Francisco Rogelio Palomo Pinto
(Universidad de Sevilla (ES))
Gemma Rius
Dr
Giulio Pellegrini
(Centro Nacional de Microelectrónica (IMB-CNM-CSIC) (ES))
Ivan Lopez Paz
(The Barcelona Institute of Science and Technology (BIST) (ES))
Ivan Vila Alvarez
(Instituto de Física de Cantabria (CSIC-UC))
Javier Garcia Lopez
(University of Seville)
Dr
Joan Marc Rafí
(Consejo Superior de Investigaciones Cientificas (CSIC) (ES))
Marcos Fernandez Garcia
(Universidad de Cantabria and CSIC (ES))
Dr
Maria Del Carmen Jimenez Ramos
(Universidad de Sevilla (ES))
Michael Moll
(CERN)
Moritz Wiehe
(CERN)
Raul Montero
Richard Jaramillo Echeverria
(Universidad de Cantabria and CSIC (ES))
Sebastian Pape
(Technische Universitaet Dortmund (DE))
