Speaker
Xianhe Huang
(University of Electronic Science and Technology of China)
Description
In the experiment of a 10MHz low phase noise crystal oscillator, a collapse phenomenon was ob-served in the phase noise curve when testing with Agilent E5052B. It was believed that this was caused by the instrument's background noise. The numerical relationship of this phenomenon was estimated, and a solution was proposed.
Primary authors
Xianhe Huang
(University of Electronic Science and Technology of China)
Ms
Wei Fu
(University of Electronic Science and Technology of China)
