17–21 Apr 2023
DESY
Europe/Zurich timezone

Beam-test Evaluation of Single-die Bonded Hybrid Assemblies and Timepix3-iLGAD Devices

20 Apr 2023, 10:40
20m
DESY Auditorium

DESY Auditorium

Talk Sensors

Speaker

Peter Svihra (CERN)

Description

Single die-bonding enables prototyping of new devices produced in Multi-Project-Wafer submissions. This contribution will introduce two alternative interconnect approaches developed within the scope of the CERN EP-R&D and AIDAinnova projects: single-die bump-bonding and in-house anisotropic conductive adhesive bonding. Focus will be on the interconnect characterisation of the CLICpix2 and Timepix3 hybrid assemblies with planar silicon sensors. Furthermore, the first results of large-area inverse Low-Gain Avalanche Detectors with 55 um pixel pitch bonded to a Timepix3 readout-chip will be discussed. Noteworthy aspects of the device performance include gain uniformity and timing performance.
The analysed data are obtained from a 120GeV/c pion beam provided at the CERN SPS North Area. Tracking and time-stamping is achieved by the CLICdp Timepix3-based beam telescope setup. Efforts into future-proofing the setup with picosecond track-time resolution, environmental and data-quality monitoring will also be presented.

Authors

Dominik Dannheim (CERN) Eric Buschmann (CERN) Janis Viktor Schmidt (KIT - Karlsruhe Institute of Technology (DE)) Justus Braach (CERN, Hamburg University (DE)) Mateus Vicente Barreto Pinto (Universite de Geneve (CH)) Patrik Novotny (Czech Academy of Sciences (CZ)) Peter Svihra (CERN)

Presentation materials